Publication:
Characterizing artifacts in RR stress test time series

dc.contributor.authorAstudillo Salinas, Darwin Fabián
dc.contributor.authorMedina Molina, Ruben
dc.contributor.authorPalacio Baus, Kenneth Samuel
dc.contributor.authorSolano Quinde, Lizandro Damián
dc.contributor.authorWong De Balzan, Sara
dc.date.accessioned2018-01-11T16:47:52Z
dc.date.available2018-01-11T16:47:52Z
dc.date.issued2016-08-16
dc.description.abstractElectrocardiographic stress test records have a lot of artifacts. In this paper we explore a simple method to characterize the amount of artifacts present in unprocessed RR stress test time series. Four time series classes were defined: Very good lead, Good lead, Low quality lead and Useless lead. 65 ECG, 8 lead, records of stress test series were analyzed. Firstly, RR-time series were annotated by two experts. The automatic methodology is based on dividing the RR-time series in non-overlapping windows. Each window is marked as noisy whenever it exceeds an established standard deviation threshold (SDT). Series are classified according to the percentage of windows that exceeds a given value, based upon the first manual annotation. Different SDT were explored. Results show that SDT close to 20% (as a percentage of the mean) provides the best results. The coincidence between annotators classification is 70.77% whereas, the coincidence between the second annotator and the automatic method providing the best matches is larger than 63%. Leads classified as Very good leads and Good leads could be combined to improve automatic heartbeat labeling.
dc.description.cityOrlando Florida
dc.identifier.doi10.1109/EMBC.2016.7590796
dc.identifier.isbn9781457702204
dc.identifier.issn1557170X
dc.identifier.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85009064458&doi=10.1109%2fEMBC.2016.7590796&partnerID=40&md5=35f14b3a2bc7631b2c524ca31377d60b
dc.identifier.urihttp://dspace.ucuenca.edu.ec/handle/123456789/29258
dc.language.isoen_US
dc.publisherINSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS INC.
dc.sourceProceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS
dc.titleCharacterizing artifacts in RR stress test time series
dc.typeArticle
dc.ucuenca.afiliacionastudillo-salinas, f., department of electrical, electronic engineering and telecommunications, university of cuenca, cuenca, ecuador
dc.ucuenca.afiliacionmedina, r., department of electrical, electronic engineering and telecommunications, university of cuenca, cuenca, ecuador
dc.ucuenca.afiliacionpalacio-baus, k., department of electrical, electronic engineering and telecommunications, university of cuenca, cuenca, ecuador
dc.ucuenca.afiliacionsolano-quinde, l., department of electrical, electronic engineering and telecommunications, university of cuenca, cuenca, ecuador
dc.ucuenca.afiliacionwong, s., department of electrical, electronic engineering and telecommunications, university of cuenca, cuenca, ecuador
dc.ucuenca.embargoend2022-01-01 0:00
dc.ucuenca.idautor0103907036
dc.ucuenca.idautor102520123
dc.ucuenca.idautor0103566360
dc.ucuenca.idautor0102428893
dc.ucuenca.idautor081929618
dc.ucuenca.indicebibliograficoSCOPUS
dc.ucuenca.nombrerevista38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society EMBC 2016
dc.ucuenca.numerocitaciones1
dc.ucuenca.volumen2016-October
dspace.entity.typePublication
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relation.isAuthorOfPublication2541297e-ad0c-4d25-8354-4d5bce749f5c
relation.isAuthorOfPublicationdb82deb3-5465-4f62-b097-bf4beba1623a
relation.isAuthorOfPublication.latestForDiscovery0ace217e-689c-4f2a-bbbf-0b5171b24110

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