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DC Field | Value | Language |
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dc.contributor.author | Astudillo Salinas, Darwin Fabián | - |
dc.contributor.author | Medina Molina, Ruben | - |
dc.contributor.author | Palacio Baus, Kenneth Samuel | - |
dc.contributor.author | Solano Quinde, Lizandro Damian | - |
dc.contributor.author | Wong De Balzan, Sara | - |
dc.date.accessioned | 2018-01-11T16:47:52Z | - |
dc.date.available | 2018-01-11T16:47:52Z | - |
dc.date.issued | 2016-08-16 | - |
dc.identifier.isbn | 9781457702204 | - |
dc.identifier.issn | 1557170X | - |
dc.identifier.uri | https://www.scopus.com/inward/record.uri?eid=2-s2.0-85009064458&doi=10.1109%2fEMBC.2016.7590796&partnerID=40&md5=35f14b3a2bc7631b2c524ca31377d60b | - |
dc.identifier.uri | http://dspace.ucuenca.edu.ec/handle/123456789/29258 | - |
dc.description.abstract | Electrocardiographic stress test records have a lot of artifacts. In this paper we explore a simple method to characterize the amount of artifacts present in unprocessed RR stress test time series. Four time series classes were defined: Very good lead, Good lead, Low quality lead and Useless lead. 65 ECG, 8 lead, records of stress test series were analyzed. Firstly, RR-time series were annotated by two experts. The automatic methodology is based on dividing the RR-time series in non-overlapping windows. Each window is marked as noisy whenever it exceeds an established standard deviation threshold (SDT). Series are classified according to the percentage of windows that exceeds a given value, based upon the first manual annotation. Different SDT were explored. Results show that SDT close to 20% (as a percentage of the mean) provides the best results. The coincidence between annotators classification is 70.77% whereas, the coincidence between the second annotator and the automatic method providing the best matches is larger than 63%. Leads classified as Very good leads and Good leads could be combined to improve automatic heartbeat labeling. | - |
dc.language.iso | en_US | - |
dc.publisher | INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS INC. | - |
dc.source | Proceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS | - |
dc.title | Characterizing artifacts in RR stress test time series | - |
dc.type | Article | - |
dc.description.city | Orlando Florida | - |
dc.ucuenca.idautor | 0103907036 | - |
dc.ucuenca.idautor | 102520123 | - |
dc.ucuenca.idautor | 0103566360 | - |
dc.ucuenca.idautor | 0102428893 | - |
dc.ucuenca.idautor | 081929618 | - |
dc.identifier.doi | 10.1109/EMBC.2016.7590796 | - |
dc.ucuenca.embargoend | 2022-01-01 0:00 | - |
dc.ucuenca.afiliacion | astudillo-salinas, f., department of electrical, electronic engineering and telecommunications, university of cuenca, cuenca, ecuador | - |
dc.ucuenca.afiliacion | medina, r., department of electrical, electronic engineering and telecommunications, university of cuenca, cuenca, ecuador | - |
dc.ucuenca.afiliacion | palacio-baus, k., department of electrical, electronic engineering and telecommunications, university of cuenca, cuenca, ecuador | - |
dc.ucuenca.afiliacion | solano-quinde, l., department of electrical, electronic engineering and telecommunications, university of cuenca, cuenca, ecuador | - |
dc.ucuenca.afiliacion | wong, s., department of electrical, electronic engineering and telecommunications, university of cuenca, cuenca, ecuador | - |
dc.ucuenca.volumen | 2016-October | - |
dc.ucuenca.indicebibliografico | SCOPUS | - |
dc.ucuenca.numerocitaciones | 1 | - |
dc.ucuenca.nombrerevista | 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society EMBC 2016 | - |
Appears in Collections: | Artículos |
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documento.pdf | 168.92 kB | Adobe PDF | View/Open |
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